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固液界面水化膜結構研究進展

Research progress on the structure of hydration films at solid–liquid interfaces

  • 摘要: 固液界面廣泛存在于物質世界中,界面性質的變化在礦物浮選、石油開采以及土壤改良等領域具有重要作用,水化膜作為固液界面上的微納米結構,對固液界面性質起到決定性的作用,水化膜的結構與厚度受固體表面性質與溶液性質的影響. 本文以云母和方解石兩種常見礦物為例,總結了利用X射線反射率測量和原子力顯微鏡觀察兩種方法探索礦物?水界面水化膜結構的研究進展,探討了不同礦物表面水化膜的結構特點,討論了溶液中金屬陽離子及礦物表面解離離子對水化膜結構的影響,對比了兩種方法所測水化膜結構的異同點. 旨在深化對固液界面水合結構的理解,推動水化膜動力學行為的深入研究.

     

    Abstract: Solid–liquid interfaces are pervasive across the material world, playing a crucial role in various fields such as mineral flotation, oil mining and processing, and soil improvement. At these interfaces, the hydration film, a nanostructure, significantly influences their properties. The structure and thickness of the hydrated film are affected by the properties of the solid surface and the solution. This review takes mica and calcite as examples and summarizes advances in understanding the structure of hydration films at solid–liquid interfaces through X-ray reflectivity (XR) and atomic force microscopy (AFM). It discusses the structures of hydration films on different mineral surfaces. It discusses how metal cations in solution, as well as ion dissociation, affect the mineral surface on these structures. The mica surface participates in ion exchange with H3O+ or other cations in the solution, resulting in a hydration film consisting of an adsorbed layer followed by the first and second hydration layers. Ca2+ and \mathrmCO_3^2- dissociate and interact with the hydration film, creating a checkerboard-like pattern. The hydration film encompasses four layers, with Ca2+ and \mathrmCO_3^2- sites alternating within. The thickness of the hydration film varies with ion concentration and type in the solution. For example, as the K+ concentration increases, the thickness of the hydration film on the mica surface increases. However, when K+ is replaced by Cs+ in the solution, the thickness of the hydration film on the mica surface reduces or even disrupts this film. The hydration film structures obtained by XR and AFM are also compared. XR measurements provide the electron density distribution on the crystal surface, allowing for analysis of the hydration film’s structure. By contrast, AFM measures the force–distance curve between the probe and the water on the sample surface, along with corresponding imaging. Both XR and AFM provide information on the thickness and structure of the hydration film on the mineral surface. However, the boundary between the mineral surface’s hydration film and bulk water is not defined owing to the dynamic nature of hydration films, leading to variations in measured thickness across different instruments, generally in the range of several nanometers. The objective of this review is to deepen understanding of the hydration structure at the solid–liquid interface, promoting further research into the dynamic behavior of hydration films.

     

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