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CVD金剛石薄膜的織構分析

Texture Analysis of CVD Diamond Thin Films

  • 摘要: 采用極圖和取向分布函數法分析CVD金剛石薄膜的不同織構.分析表明,高的多重性因子使得110面織構有更高的出現概率.具體分析了221面織構出現的孿生機制,強調了織構與性能關系研究的重要性,并推薦使用先進織構分析手段.

     

    Abstract: Different textures of CVD diamond thin films are analyzed using the methods of pole figure and orientation distribution function. It is shown that the higher multiplicity leads to the higher appearance possibility of 110 fiber texture. The formation mechanism of 221 fiber texture by means of twinning effect is discussed. The importance of the systematic investigation on the relatonship between tetures and properties is emphasized, and the advanced methods for texture analysis are recommended.

     

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